Electromagnetic robustness validation for gate drivers
Conference: PCIM Europe 2014 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05/20/2014 - 05/22/2014 at Nürnberg, Deutschland
Proceedings: PCIM Europe 2014
Pages: 7Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Junk, Stefan; Hoene, Eckart (Fraunhofer IZM, Germany)
Drivers for high power semiconductors operate in an electromagnetically demanding environment. Nevertheless, up to now their robustness against current and voltage transients or electric and magnetic fields is rarely quantified. In this paper measurements of these parameters were carried out in a railway traction inverter. Based on the results measurement setups were developed and test levels defined that lead to a robustness qualification.