Synchronous Observing Methodology of Surface Images and Energy Data at Power Chip Destruction
Conference: PCIM Europe 2017 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05/16/2017 - 05/18/2017 at Nürnberg, Deutschland
Proceedings: PCIM Europe 2017
Pages: 4Language: englishTyp: PDF
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Authors:
Tadakuma, Toshiya; Goto, Akiko; Nagahara, Teruaki; Yamada, Junji (Mitsubishi Electric Corporation Power Device Works, Japan)
Abstract:
Power devices suppliers are often required to analyze factors or reasons when failure occurred in the market. We usually use static analysis method; however some cases are hard to seek its true cause. This paper introduces dynamically observing method for IGBT destruction with ultrahigh speed camera. The system can capture its origin of the destruction and its ongoing status. It also takes synchronous data of voltage and current. Observed data at various situations and conditions will enable to get more precise estimation of the destruction cause and also incorporate a countermeasure at the initial design stage.