Precise Voltage Measurement for Power Electronics with High Switching Frequencies
Conference: PCIM Europe 2018 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06/05/2018 - 06/07/2018 at Nürnberg, Deutschland
Proceedings: PCIM Europe 2018
Pages: 6Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Nitzsche, Maximilian; Zehelein, Matthias; Troester, Nathan; Roth-Stielow, Joerg (Institute for Power Electronics and Electrical Drives, University of Stuttgart, Germany)
In this paper different approaches in precise measurement of gate voltages as well as drain-source voltages of modern SiC and GaN transistors are compared. An approach to calculate the necessary bandwidth of a voltage probe to reproduce the voltage slope is presented. Furthermore, state-ofthe- art voltage probes are compared in means of bandwidth, common mode reduction and response on EMI.