Power cycle test with switching losses and integrated hot-spot measurement

Conference: PCIM Europe digital days 2020 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
07/07/2020 - 07/08/2020 at Deutschland

Proceedings: PCIM Europe digital days 2020

Pages: 7Language: englishTyp: PDF

Krupin, Alexey; Fuhrmann, Jan; Eckel, Hans-Guenter (University of Rostock, Germany)

The power cycle test is used to determine the lifetime of power semiconductors. To determine the process of aging of the semiconductor module typically Zth measurements or optical/acoustic investigations are necessary, which is often a big effort. This paper presents a new test setup for power cycle investigation with switching losses, blocking voltage and hot-spot detection, revealing delaminations. For the investigation, a not commonly used thermo-sensitive electric parameters (TSEPs) are utilized - the leakage current, which offers a great dependence on the hot-spot temperature.