Modular Dynamic Characterization Bench for Wide Bandgap Power Semiconductors
Conference: PCIM Europe 2022 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05/10/2022 - 05/12/2022 at Nürnberg, Germany
doi:10.30420/565822155
Proceedings: PCIM Europe 2022
Pages: 8Language: englishTyp: PDF
Authors:
Jimenez, Sergio; Lemmon, Andrew; New, Christopher (The University of Alabama, USA)
Nelson, Blake (Wolfspeed, Inc., USA)
Abstract:
The double pulse test (DPT) is a widely accepted method to measure the switching performance of power semiconductor devices. This technique usually requires an iterative and lengthy process for developing custom circuitry for each individual semiconductor device evaluated. This paper presents the design of a generalized and modular DPT characterization testbed. This testbed supports the characterization of a wide variety of semiconductor technologies with different packages and power ratings, with minimal effort required to accommodate new devices.