Device Model of CSTBT with Highly Dosed Carrier Density in CS Layer

Conference: PCIM Europe 2023 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05/09/2023 - 05/11/2023 at Nürnberg, Germany

doi:10.30420/566091306

Proceedings: PCIM Europe 2023

Pages: 5Language: englishTyp: PDF

Authors:
Tadakuma, Toshiya; Joko, Motonobu (Mitsubishi Electric Corporation, Japan)
He, Daniel; Stumpf, Eugen (Mitsubishi Electric Europe B.V., Germany)

Abstract:
This paper proposes an IGBT(CSTBT) model based on a physical model, for circuit simulation that is widely applied in inverters for motor control. The target CSTBT has highly dosed electron density in carrier stored N layer (CS layer) and highly effects on turn-on operation faster. The model is based on MOSFET and PiN Diode with voltage dependent capacitances (CCG and CCE) and constant CGE and is featured that a dynamical phenomenon which hole as carrier stored in CS layer around gate structure conducts steeply through channel is expressed by a structure consisted of a capacitor at drain part of MOSFET and an imaginary power supply with switch. And the proposed model is validated by compar-ison between simulation and actual measurement of current dependencies of switching losses and speeds.