Evaluation of a Next Generation 750 V SiC MOSFET for 400 V EV Powertrain Applications

Conference: PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05/06/2025 - 05/08/2025 at Nürnberg, Germany

doi:10.30420/566541234

Proceedings: PCIM Conference 2025

Pages: Language: englishTyp: PDF

Personal VDE Members are entitled to a 10% discount on this title

Authors:
Romero, Amy; Aponte, Erick; Casady, Jeffrey; Lenz, Kevin

Abstract:
There are a wide range of powertrain applications that still use a 400 V bus and similarly higher voltage nodes where having high power density is especially important. To address this, a next generation Wolfspeed 750 V SiC MOSFET die is introduced that is 7.2 mOmega at room temperature which is a 25% reduction from the previous generation. A comparison of the static characteristics for a single die and the dynamic characteristics of four die paralleled in a test module are shown. At 500 V and 400 A, the total switching losses are less than 11 mJ. The results are used to do a system level simulation that looks at the impact of the improvements against an IGBT at a similar power level, which is the main competitor in 400 V powertrain applications. The results show that the next generation die has a third of the losses of the IGBT under similar system conditions and the next generation die has an even larger reduction of 18% lower losses over the previous generation die.