Analysis of Deskew Methods used in Double Pulse Test and Their Challenges

Conference: PCIM Conference 2025 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05/06/2025 - 05/08/2025 at Nürnberg, Germany

doi:10.30420/566541315

Proceedings: PCIM Conference 2025

Pages: Language: englishTyp: PDF

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Authors:
Patel, Nirali; Kuzmanoska, Sara; Richert, Lukas; Rehlaender, Philipp; Zhou, Edward; Pham, Thanh-Toan

Abstract:
To calculate the switching losses for wide-band gap (WBG) semiconductor devices using double pulse test (DPT), it is essential that measured current and voltage signals are properly aligned to ensure accurate switching loss calculations. Different measurement probes introduce varying signal propagation times between the current and voltage measurement. This delay must be properly aligned to ensure accurate turn-on and turn-off loss distributions. This paper reviews different deskew methods that have been described in the literature and their respective challenges. It then showcases a suitable deskew method for DPT, which also aids in determining the parasitic inductance of the setup.