1
Magnetische Felder an Widerstandsschweißeinrichtungen (WSE)
Authors:
Börner, Fritz
Conference:
EMV 2008 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit
2
Magnetische Nanopartikel für Anwendungen in biochemischer Analytik und medizinischer Diagnostik
Authors:
Schilling, Meinhard; Ludwig, Frank
Conference:
VDE-Kongress 2008 - Zukunftstechnologien: Innovationen - Märkte - Nachwuchs
3
Magnetorheologische Aktoren in der Automatisierungstechnik
Authors:
Wiehe, Ansgar; Maas, Jürgen
Conference:
VDE-Kongress 2008 - Zukunftstechnologien: Innovationen - Märkte - Nachwuchs
4
Makromodellierung leistungselektronischer Bauelemente für die effiziente EMV-Simulation komplexer Systeme
Authors:
Thamm, S.; Leone, M.
Conference:
EMV 2008 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit
5
MAMSplus - Individuelle Dienste für jedermann
Authors:
Staiger, Ulrich
Conference:
VDE-Kongress 2008 - Zukunftstechnologien: Innovationen - Märkte - Nachwuchs
6
Mapping Ionospheric TEC using Faraday Rotation in Full- Polarimetric L-Band SAR Data
Authors:
Meyer, Franz; Nicoll, Jeremy
Conference:
EUSAR 2008 - 7th European Conference on Synthetic Aperture Radar
7
Mappings for BICM in UWB Scenarios
Authors:
Stierstorfer, Clemens; Fischer, Robert F. H.
Conference:
SCC'08 - 7th International ITG Conference on Source and Channel Coding
8
Market Rules and Operational Practice in Chile
Authors:
Gonzales, Celso; Pöller, Markus
Conference:
Netzregelung und Systemführung - 9. GMA/ETG-Fachtagung
9
Mask CD measurement approach by diffraction intensity for lithography equivalent
Authors:
Nagai, Takaharu; Mesuda, Kei; Sutou, Takanori; Inazuki, Yuichi; Hashimoto, Hiroyuki; Yokoyama, Toshifumi; Toyama, Nobuhito; Morikawa, Yasutaka; Mohri, Hiroshi; Hayashi, Naoya
Conference:
EMLC 2008 - 24th European Mask and Lithography Conference
10
Mask Data Rank (MDR) and its Application
Authors:
Kato, Kokoro; Endo, Masakazu; Inoue, Tadao; Yamabe, Masaki
Conference:
EMLC 2008 - 24th European Mask and Lithography Conference
11
Mask Industry Assessment Trend Analysis
Authors:
Shelden, Gilbert; Marmillion, Patrica; Hughes, Greg
Conference:
EMLC 2008 - 24th European Mask and Lithography Conference
12
Maßnahmen in elektrischen Anlagen zur Minimierung niederfrequenter Magnetfelder
Authors:
Zschau, Gerd; Gonschorek, Karl-Heinz
Conference:
EMV 2008 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit
13
Material Characterization of Liquid Crystals at THz-Frequencies using a Free Space Measurement Setup
Authors:
Koeberle, M.; Göbel, T.; Schönherr, D.; Mueller, S.; Jakoby, R.; Meissner, P.; Hartnagel, H.-L.
Conference:
GeMIC 2008 - German Microwave Conference
14
May we reach it? Or must we? In what time? With what probability?
Authors:
Hermanns, Holger; Johr, Sven
Conference:
MMB 2008 - 14th GI/ITG Conference - Measurement, Modelling and Evalutation of Computer and Communication Systems
15
Measurement based satellite to outdoor channel modeling for multiple satellite systems
Authors:
Milojevic, Marko; Haardt, Martin; Heuberger, Albert
Conference:
European Wireless 2008 - 14th European Wireless Conference
16
Measurement-Based Modeling of NGN Access Networks from an Application Perspective
Authors:
Fabini, Joachim; Reichl, Peter; Poropatich, Alexander
Conference:
MMB 2008 - 14th GI/ITG Conference - Measurement, Modelling and Evalutation of Computer and Communication Systems
17
Measurements and modeling of multiple reflections effect in building materials for indoor communication systems at THz frequencies
Authors:
Piesiewicz, R.; Jansen, C.; Koch, M.; Kürner, T.
Conference:
GeMIC 2008 - German Microwave Conference
18
Measurements of Multi-Antenna Gains using a 3GPP-LTE Air Interface in Typical Indoor and Outdoor Scenarios
Authors:
Haustein, T.; Venkatkumar, V.; Eichinger, J.; Schulz, E.; Wirth, T.; Jungnickel, V.; Forck, A.; Wahls, S.; Juchems, C.; Luhn, F.; Zavrtak, R.
Conference:
European Wireless 2008 - 14th European Wireless Conference
19
Measuring Contact Hole Corner Rounding Uniformity Using Optical Scatterometry
Authors:
Lam, John C.; Gray, Alexander; Chen, Stanley; Richter, Jan
Conference:
EMLC 2008 - 24th European Mask and Lithography Conference
20
Measuring the cumulative PMD of buried fibers in the network of Deutsche Telekom in a field trial using an RS-POTDR prototype
Authors:
Fritzsche, D.; Paul, M.; Schuerer, L.; Ehrhardt, A.; Breuer, D.; Weiershausen, W.; Cyr, N.; Chen, H.; Schinn, G. W.
Conference:
Photonische Netze - 9. ITG-Fachtagung