Cover IEC 60749-1:2002
größer

IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Circulation Date: 2002-08
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 15 VDE Artno.: 210114

Content

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.