Cover IEC 60749-36:2003

IEC 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Circulation Date: 2003-02
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 7 VDE Artno.: 210499


Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.