IEC 60749-2:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Circulation Date:
2003-08
Edition:
1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 1 VDE Artno.: 210974
Modification of the validity date: now put at 2007.