Cover IEC 60749-23:2004

IEC 60749-23:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Circulation Date: 2004-02
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 17 VDE Artno.: 211268


This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.