Cover IEC 62373:2006
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IEC 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Circulation Date: 2006-07
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 27 VDE Artno.: 212915

Content

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)