Cover IEC 62416:2010
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IEC 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors

Circulation Date: 2010-04
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 20 VDE Artno.: 217130

Content

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.