Cover IEC 62415:2010
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IEC 62415:2010

Semiconductor devices - Constant current electromigration test

Circulation Date: 2010-05
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 22 VDE Artno.: 217200

Content

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.