IEC 60749-27:2006/AMD1:2012

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Circulation Date: 2012-09
Edition: 2.0
Language: EN-FR - bilingual english/french
Seitenzahl: 5 VDE Artno.: 219204