Cover IEC TR 63133:2017

IEC TR 63133:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

Circulation Date: 2017-10
Edition: 1.0
Language: EN - english
Seitenzahl: 17 VDE Artno.: 225041


IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.