Cover IEC 62969-4:2018
größer

IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Circulation Date: 2018-06
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 39 VDE Artno.: 225745

Content

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.