IEC TR 63571:2025

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

IEC 62047-50:2025

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

IEC 62047-46:2025

Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of tensile strength of nanoscale thickness membrane

IEC 62047-45:2025

Semiconductor devices - Micro-electromechanical devices - Part 45: Silicon based MEMS fabrication technology - Measurement method of impact resistance of nanostructures

IEC 60747-15:2024 RLV

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices

IEC 60747-15:2024

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices

IEC 60747-16-9:2024

Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters

IEC 62047-47:2024

Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures

IEC 62047-48:2024

Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device

IEC 62047-43:2024

Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

IEC 62047-44:2024

Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

IEC 60747-5-16:2023

Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy

IEC 60747-18-4:2023

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

IEC 60747-18-5:2023

Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light

IEC 62951-8:2023

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

IEC 62951-9:2022

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

IEC 63364-1:2022

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

IEC 60747-16-7:2022

Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators

IEC 60747-16-8:2022

Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters

IEC TR 63357:2022

Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles