Cover IEC 60749-41:2020

IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Circulation Date: 2020-07
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 44 VDE Artno.: 248996


IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.