IEC 62899-202-11:2025
Printed electronics - Part 202-11: Materials - Conductive ink - Measurement method of electrical resistance uniformity for large area printed conductive layer
Circulation Date:
2025-04
Edition:
1.0
Language: EN - english
Seitenzahl: 13 VDE Artno.: 255013
IEC 62899-202-11:2025 specifies a measurement method of electrical resistance uniformity for large area printed conductive layers. The purpose of this method is to measure resistance uniformity of planar large area printed layers. This method cannot measure sheet resistance. The methods measure electrical resistance or electrical potential drop and use direct contact.