IEC TR 63571:2025
Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
Circulation Date:
2025-05
Edition:
1.0
Language: EN - english
Seitenzahl: 24 VDE Artno.: 255075
IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.