IEC 60749-13:2018Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
80.00 €
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IEC 60749-26:2018Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
300.00 €
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IEC 60749-12:2017Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
20.00 €
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IEC 62969-1:2017Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
80.00 €
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IEC TR 63133:2017Semiconductor devices - Scan based ageing level estimation for semiconductor devices
115.00 €
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IEC 62880-1:2017Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
150.00 €
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IEC 62951-1:2017Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
80.00 €
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IEC 62830-3:2017Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
150.00 €
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IEC 62830-1:2017Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
150.00 €
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IEC 60749-3:2017Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
40.00 €
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IEC 60749-9:2017Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
40.00 €
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IEC 60749-6:2017Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
20.00 €
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IEC 60749-4:2017Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
40.00 €
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IEC 62435-2:2017Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
115.00 €
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IEC 62830-2:2017Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
80.00 €
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IEC 62435-1:2017Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
235.00 €
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IEC 62435-5:2017Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
150.00 €
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IEC 62047-28:2017Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
115.00 €
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IEC 60749-44:2016Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
150.00 €
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IEC 62779-3:2016Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
80.00 €
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