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IEC 62969-3:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors

155.00 € 

IEC 62969-2:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors

40.00 € 

IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

80.00 € 

IEC 60749-26:2018

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

320.00 € 

IEC 60749-12:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

20.00 € 

IEC 62969-1:2017

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors

80.00 € 

IEC TR 63133:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

115.00 € 

IEC 62880-1:2017

Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard

155.00 € 

IEC 62951-1:2017

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates

80.00 € 

IEC 62830-3:2017

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting

155.00 € 

IEC 62830-1:2017

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting

155.00 € 

IEC 60749-3:2017

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

40.00 € 

IEC 60749-9:2017

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

40.00 € 

IEC 60749-6:2017

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

20.00 € 

IEC 60749-4:2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

40.00 € 

IEC 62435-2:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

115.00 € 

IEC 62830-2:2017

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting

80.00 € 

IEC 62435-1:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General

249.99 € 

IEC 62435-5:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

155.00 € 

IEC 62047-28:2017

Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices

115.00 €