Display
order by
Page 5 of 7

IEC 60749-19:2003/AMD1:2010

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

10.00 € 

IEC 60749-32:2002/AMD1:2010

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

10.00 € 

IEC 62615:2010

Electrostatic discharge sensitivity testing - Transmission line pulse (TLP) - Component level

105.00 € 

IEC 62415:2010

Semiconductor devices - Constant current electromigration test

40.00 € 

IEC 60747-1:2006/AMD1:2010

Amendment 1 - Semiconductor devices - Part 1: General

10.00 € 

IEC 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors

40.00 € 

IEC 62417:2010

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

20.00 € 

IEC 62418:2010

Semiconductor devices - Metallization stress void test

105.00 € 

IEC 62258-1:2009

Semiconductor die products - Part 1: Procurement and use

245.00 € 

IEC 60747-1:2006/COR1:2008

Corrigendum 1 - Semiconductor devices - Part 1: General

0.00 € 

IEC TR 62258-8:2008

Semiconductor die products - Part 8: EXPRESS model schema for data exchange

175.00 € 

IEC 60749-38:2008

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

70.00 € 

IEC 60749-37:2008

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

105.00 € 

IEC TR 62258-7:2007

Semiconductor die products - Part 7: XML schema for data exchange

175.00 € 

IEC 62374:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

145.00 € 

IEC 62258-5:2006

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

70.00 € 

IEC 62258-6:2006

Semiconductor die products - Part 6: Requirements for information concerning thermal simulation

40.00 € 

IEC 60749-39:2006

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

40.00 € 

IEC 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

70.00 € 

IEC 60749-35:2006

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

145.00 €