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IEC 60749-17:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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40.00 € 

IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

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80.00 € 

IEC 60749-26:2018

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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300.00 € 

IEC 60749-12:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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20.00 € 

IEC 60749-3:2017

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

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40.00 € 

IEC 60749-9:2017

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

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40.00 € 

IEC 60749-6:2017

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

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20.00 € 

IEC 60749-4:2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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40.00 € 

IEC 60749-44:2016

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

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150.00 € 

IEC 60749-42:2014

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

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20.00 € 

IEC 60749-27:2006+AMD1:2012 CSV (Consolidated Version)

Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

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115.00 € 

IEC 60749-27:2006/AMD1:2012

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

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10.00 € 

IEC 60749-40:2011

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

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150.00 € 

IEC 60749-7:2011

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

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40.00 € 

IEC 60749-21:2011

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability

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150.00 € 

IEC 60749-29:2011

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

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150.00 € 

IEC 60749-23:2004+AMD1:2011 CSV (Consolidated Version)

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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65.00 € 

IEC 60749-23:2004/AMD1:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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10.00 € 

IEC 60749-19:2003+AMD1:2010 CSV (Consolidated Version)

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

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40.00 € 

IEC 60749-32:2002+AMD1:2010 CSV (Consolidated Version)

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

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40.00 €