IEC TS 61945:2000
Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
Circulation Date:
2000-03
Edition:
1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 23 VDE Artno.: 209305
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.