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IEC 62374-1:2010 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers » More Information 80.00 € 80.00 €
IEC 62374:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films » More Information 150.00 € 150.00 €

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