How data-driven approaches can increase the accuracy of LED reliability predictions

Conference: MikroSystemTechnik Kongress 2021 - Kongress
11/08/2021 - 11/10/2021 at Stuttgart-Ludwigsburg, Deutschland

Proceedings: MikroSystemTechnik Kongress 2021

Pages: 4Language: englishTyp: PDF

Benkner, Simon; Klir, Stefan; Herzog, Alexander; Khanh, Tran Quoc (University of Darmstadt, Darmstadt, Germany)

This paper proposes a methodology on the classification of LED degradation time-series to a suitable fitting model based on standard LED aging test data. Therefor a data set of about 2000 LED degradation curves was analyzed regarding their projected lifetime of various extrapolation models. The outcomes were compared to the standard exponential projection model. Results indicate a deviation of the projected