Efficient Condition Monitoring with Si-DMS and RFID Technology: An Autonomous RF-based Surface-Mountable Measurement System
Conference: MikroSystemTechnik KONGRESS 2025 - Mikroelektronik/Mikrosystemtechnik und ihre Anwendungen – Nachhaltigkeit und Technologiesouveränität
10/27/2025 - 10/29/2025 at Duisburg, Germany
doi:10.30420/456614093
Proceedings: MikroSystemTechnik Kongress 2025
Pages: 2Language: englishTyp: PDF
Authors:
Frank, Thomas; Hermann, Stefan; Gruen, Andre; Kermann, Manuel; Hintz, Michael; Cyriax, Andrea; Ettrich, Klaus; Peitsch, Peter; Kahl, Sebastian
Abstract:
Condition monitoring of structures and machinery is becoming increasingly important to detect wear or damage early and prevent unplanned failures. A proven method is measuring mechanical strain at exposed positions. The presented system combines visual inspections and automatic monitoring with highly sensitive silicon strain sensors (Si-DMS) and RFID technology.