This part of IEC 62804 defines procedures to test and evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high-voltage stress including potential-induced degradation (PID). Two test methods are defined that do not inherently produce equivalent results. They are given as screening tests - neither test includes all the factors existing in the natural environment that can affect the PID rate. The methods describe how to achieve a constant stress level.
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