Part 15: Electronic characteristic measurements – Intrinsic surface impedance of superconductor films at microwave frequencies
(IEC 61788-15:2011); German version EN 61788-15:2011 Class/Status:
VDE Art. No.: 0390025
This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method [13, 14]. The object of measurement is to obtain the temperature dependence of the intrinsic ZS at the resonant frequency f0.
This Document is related to the following Topics (in bold):
For more information, please see our
data protection policy.
Individual Cookie Settings
cookie_consent (Validity: 1 year)
PHPSESSID (Temporary, is removed when the browser is closed)