This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to determine the value of RF shunt resistance which degrades the quality factor of an L/C circuit when a connector is connected in parallel. This value is expressed in terms of a parallel damping resistance.