This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
This Document is related to the following Topics (in bold):
For more information, please see our
data protection policy.
Individual Cookie Settings
cookie_consent (Validity: 1 year)
PHPSESSID (Temporary, is removed when the browser is closed)