This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and setup, as well as the test procedures and content of the test reports. A test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain consistent quantitative measurements of the immunity of ICs. Critical parameters that are expected to influence the test results are described. Deviations from this standard shall be described in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.