Cover DIN EN 60749-28 VDE 0884-749-28:2018-02

DIN EN 60749-28 VDE 0884-749-28:2018-02

* German Language Version *

Semiconductor devices – Mechanical and climatic test methods

Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – Device level

(IEC 60749-28:2017); German version EN 60749-28:2017
Class/Status: Standard, valid
Released: 2018-02
VDE Art. No.: 0800467


This part of DIN EN 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).