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DIN EN 60749-28 VDE 0884-749-28:2018-02

* German Language Version *

Semiconductor devices – Mechanical and climatic test methods

Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – Device level

(IEC 60749-28:2017); German version EN 60749-28:2017
Class/Status: Standard, valid
Released: 2018-02
VDE Art. No.: 0800467

Contents

This part of DIN EN 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).