DIN EN IEC 61967-4 VDE 0847-21-4:2023-08

Integrated circuits – Measurement of electromagnetic emissions

Part 4: Measurement of conducted emissions – 1 Ohm/150 Ohm direct coupling method

(IEC 61967-4:2021); German version EN IEC 61967-4:2021
Class/Status: Standard, valid
Released: 2023-08
VDE Art. No.: 0800882

This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ohm resistive probe and RF voltage measurement using a 150 Ohm coupling network.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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DIN EN IEC 61967-4 VDE 0847-21-4:2023-08

Integrated circuits – Measurement of electromagnetic emissions

Part 4: Measurement of conducted emissions – 1 Ohm/150 Ohm direct coupling method

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