DIN EN IEC 61000-4-20 VDE 0847-4-20:2025-03

This document contains the German version of the final draft of the planned new edition of the European Standard EN IEC 61000-4-20 and is identical to the final draft of the planned new edition of the International Standard IEC 61000-4-20. It describes methods for the measurement of high frequency electromagnetic emissions of electrical and electronical equipment and for the test of the immunity of the equipment in relation to high frequency electromagnetic fields using various types of transverse electromagnetic (TEM) waveguides. They include open (for example, striplines and EMP” simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. In relation to the previous standard, information is included on large EUTs, the validation procedure for the test volume, two-port and four-port TEM waveguides, TEM waveguide characterization, and dielectric test stands. In addition, changes to measurement uncertainty by adapting the work completed in CISPR and TC 77 have been implemented.