E DIN EN IEC 61967-8 VDE 0847-21-8:2024-01

Integrated circuits – Measurement of electromagnetic emissions

Part 8: Measurement of radiated emissions – IC stripline method

(IEC 47A/1136/CD:2022); Text in German and English
Class/Status: Draft, valid
Released: 2024 -01 Published: 2023-12 -08
VDE Art. No.: 1800760
End of objection deadline: 2024-02-08

This measurement procedure defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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E DIN EN IEC 61967-8 VDE 0847-21-8:2024-01

Integrated circuits – Measurement of electromagnetic emissions

Part 8: Measurement of radiated emissions – IC stripline method

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