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E DIN EN IEC 60749-26 VDE 0884-749-26:2025-10

Semiconductor devices – Mechanical and climatic test methods

Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)

(IEC 47/2882/CDV:2024); German and English version prEN IEC 60749-26:2024
Class/Status: Draft, valid
Released: 2025 -10 Published: 2025-09 -26
VDE Art. No.: 1800948
End of objection deadline: 2025-11-26

Note: You can pre-order this document (delivery subject to availability). Valid from 2025-10-01.

This document establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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E DIN EN IEC 60749-26 VDE 0884-749-26:2025-10

Semiconductor devices – Mechanical and climatic test methods

Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)

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