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E DIN EN IEC 63550-3 VDE 0884-3550-3:2026-05

Semiconductor devices – Neuromorphic devices

Part 3: Evaluation method of spike dependent plasticity in memristor devices

(IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025
Class/Status: Draft, valid
Released: 2026 -05   Published: 2026-04 -03
VDE Art. No.: 1801057
End of objection deadline: 2026-06-03

Note: You can pre-order this document (delivery subject to availability). Valid from 2026-05-01.

This part of IEC 63550-3 specifies the test methods for evaluating the spike-dependent plasticity of neuromorphic memristor devices. The test methods described in this international standard include spike time dependent plasticity (STDP), indirect STDP, spike rate dependent plasticity (SRDP), and their retention properties. This document may be applicable to neuromorphic memristor devices without restrictions in terms of device technology and size.