E DIN EN IEC 63244-1 VDE 0884-244-1:2020-07

Semiconductor devices – Semiconductor devices for wireless power transfer and charging

Part 1: General requirements and specifications

DIN EN IEC 60749-17 VDE 0884-749-17:2019-11

Semiconductor devices – Mechanical and climatic test methods

Part 17: Neutron irradiation

DIN EN IEC 62435-4 VDE 0884-135-4:2019-05

Electronic components – Long-term storage of electronic semiconductor devices

Part 4: Storage

DIN EN IEC 62435-6 VDE 0884-135-6:2019-04

Electronic components – Long-term storage of electronic semiconductor devices

Part 6: Packaged or finished devices

DIN EN IEC 62969-4 VDE 0884-69-4:2019-03

Semiconductor devices – Semiconductor interface for automotive vehicles

Part 4: Evaluation method of data interface for automotive vehicle sensors

E DIN EN IEC 62435-8 VDE 0884-135-8:2019-03

Long-term storage of electronic components

Part 8: Passive electronic devices

E DIN EN IEC 62435-7 VDE 0884-135-7:2019-02

Long-term storage of electronic components

Part 7: Micro-electromechanical devices

DIN EN IEC 62969-3 VDE 0884-69-3:2018-12

Semiconductor devices – Semiconductor interface for automotive vehicles

Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors

DIN EN IEC 60749-26 VDE 0884-749-26:2018-10

Semiconductor devices – Mechanical and climatic test methods

Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)

DIN EN IEC 62969-2 VDE 0884-69-2:2018-09

Semiconductor devices – Semiconductor interface for automotive vehicles

Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors

DIN EN IEC 62969-1 VDE 0884-69-1:2018-08

Semiconductor devices – Semiconductor interface for automotive vehicles

Part 1: General requirements of power interface for automotive vehicle sensors

E DIN EN 62435-3 VDE 0884-135-3:2018-02

Electronic components – Long-term storage of electronic semiconductor devices

Part 3: Data

DIN EN 60749-28 VDE 0884-749-28:2018-02

Semiconductor devices – Mechanical and climatic test methods

Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – Device level

DIN EN 62435-1 VDE 0884-135-1:2017-10

Electronic components – Long-term storage of electronic semiconductor devices

Part 1: General

DIN EN 62435-2 VDE 0884-135-2:2017-10

Electronic components – Long-term storage of electronic semiconductor devices

Part 2: Deterioration mechanisms

DIN EN 62435-5 VDE 0884-135-5:2017-10

Electronic components – Long-term storage of electronic semiconductor devices

Part 5: Die and wafer devices

E DIN EN 60747-5-5 VDE 0884-5:2017-03

Semiconductor devices – Discrete devices

Part 5-5: Optoelectronic devices – Photocouplers

DIN EN 62779-3 VDE 0884-79-3:2017-03

Semiconductor devices – Semiconductor interface for human body communication

Part 3: Functional type and its operational conditions

DIN VDE V 0884-11 VDE V 0884-11:2017-01

Semiconductor devices

Part 11: Magnetic and capacitive coupler for basic and reinforced isolation

DIN EN 62779-1 VDE 0884-79-1:2017-01

Semiconductor devices – Semiconductor interface for human body communication

Part 1: General requirements