DIN EN 60749-28 VDE 0884-749-28:2018-02

Semiconductor devices – Mechanical and climatic test methods

Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – Device level

DIN EN 62435-1 VDE 0884-135-1:2017-10

Electronic components – Long-term storage of electronic semiconductor devices

Part 1: General

DIN EN 62435-2 VDE 0884-135-2:2017-10

Electronic components – Long-term storage of electronic semiconductor devices

Part 2: Deterioration mechanisms

DIN EN 62435-5 VDE 0884-135-5:2017-10

Electronic components – Long-term storage of electronic semiconductor devices

Part 5: Die and wafer devices

DIN EN 62779-3 VDE 0884-79-3:2017-03

Semiconductor devices – Semiconductor interface for human body communication

Part 3: Functional type and its operational conditions

DIN VDE V 0884-11 VDE V 0884-11:2017-01

Semiconductor devices

Part 11: Magnetic and capacitive coupler for basic and reinforced isolation

It is planned to withdraw this standard Click here for further informations

DIN EN 62779-1 VDE 0884-79-1:2017-01

Semiconductor devices – Semiconductor interface for human body communication

Part 1: General requirements

DIN EN 62779-2 VDE 0884-79-2:2017-01

Semiconductor devices – Semiconductor interface for human body communication

Part 2: Characterization of interfacing performances

DIN EN 60747-5-5 VDE 0884-5:2015-11

Semiconductor devices – Discrete devices

Part 5-5: Optoelectronic devices – Photocouplers

DIN EN 60749-26 VDE 0884-749-26:2014-09

Semiconductor devices – Mechanical and climatic test methods

Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)

DIN EN 60747-5-5 VDE 0884-5:2011-11

Semiconductor devices – Discrete devices

Part 5-5: Optoelectronic devices – Photocouplers

DIN EN 62258-1 VDE 0884-101:2011-04

Semiconductor die products

Part 1: Procurement and use

DIN V VDE V 0884-10 VDE V 0884-10 Berichtigung 1:2007-03

Corrigenda to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12

DIN V VDE V 0884-10 VDE V 0884-10:2006-12

Semiconductor devices

Magnetic and capacitive couplers for safe isolation

DIN EN 60747-5-1 VDE 0884-1:2003-01

Discrete semiconductor devices and integrated circuits

Optoelectronic devices – General

DIN EN 60747-5-2 VDE 0884-2:2003-01

Discrete semiconductor devices and integrated circuits

Optoelectronic devices ­ Essential ratings and characteristics

DIN EN 60747-5-3 VDE 0884-3:2003-01

Discrete semiconductor devices and integrated circuits

Optoelectronic devices ­ Measuring methods

DIN EN 60747-5-1 VDE 0884-1:2002-09

Discrete semiconductor devices and integrated circuits

Optoelectronic devices ­ Generales

DIN EN 60747-5-1 VDE 0884-1:2002-04

Discrete semiconductor devices and integrated circuits

Optoelectronic devices ­ Generales

DIN EN 60747-5-2 VDE 0884-2:2002-04

Discrete semiconductor devices and integrated circuits

Optoelectronic devices ­ Essential ratings and characteristics