IEC 61189-2-720:2024
Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-720: Detection of defects in interconnection structures by measurement of capacitance
Circulation Date:
2024-03
Edition:
1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 21 VDE Artno.: 252668
IEC 61189-2-720:2024 provides a method to evaluate specific characteristics of circuit boards by measuring the capacitance between conductor traces and a ground plane and can be used for qualitative comparison of a test specimen to a reference board. This method is not intended for quantitative measurements and for assessment of conformity to a specification.