IEC 62779-4:2020Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
115.00 €
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IEC 62830-6:2019Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
155.00 €
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IEC 60749-20-1:2019 RLVSemiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
476.00 €
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IEC 60749-20-1:2019Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
280.00 €
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IEC 63150-1:2019Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
249.99 €
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IEC 62951-6:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
155.00 €
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IEC 62951-2:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
40.00 €
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IEC 60749-18:2019 RLVSemiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
264.00 €
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IEC 60749-18:2019Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
155.00 €
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IEC 60749-17:2019Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
40.00 €
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IEC 62830-4:2019Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
249.99 €
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IEC 62951-4:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
80.00 €
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IEC 62951-5:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
115.00 €
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IEC 62951-7:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
80.00 €
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IEC 63068-1:2019Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
155.00 €
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IEC 63068-2:2019Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
155.00 €
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IEC 62951-3:2018Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
155.00 €
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IEC 62435-6:2018Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
115.00 €
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IEC 62969-4:2018Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
115.00 €
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IEC 62435-4:2018Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
115.00 €
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