1
3D: Defects and Reliability
Authors:
Wahl, Michael; Gruenewald, Armin; Hahn, Kai; Brueck, Rainer
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
2
Abstract Technology Handling for Generator-Based Analog Circuit Design
Authors:
Prautsch, Benjamin; Eichler, Uwe; Reich, Torsten; Puppala, Ajith; Lienig, Jens
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
3
Analytical model for ideal generic memristor circuits based on the theory of Volterra
Authors:
Ascoli, A.; Tetzlaff, R.
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
4
Bond Wire Design with the Bond Calculator
Authors:
Jung, Carl Christoph; Silber, Christian; Scheible, Juergen
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
5
Constraint Propagation Methods for Robust IC Design
Authors:
Krinke, Andreas; Jerke, Goeran; Lienig, Jens
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
6
Correcting Delay Faults and Transient Faults in Pipelines
Authors:
Scharoba, Stefan; Koal, Tobias; Vierhaus, Heinrich T.
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
7
Cost and Reliability Trade-off during the Development of Heterogeneous 3D-Systems
Authors:
Gruenewald, Armin; Wahl, Michael; Brueck, Rainer
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
8
Coverage of Uncertainties in Cyber-Physical Systems
Authors:
Chipman, William; Grimm, Christoph; Radojicic, Carna
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
9
Extending Microprocessor Trace Hardware for Fault Injection
Authors:
Gunia, Marco; Zabel, Martin; Spallek, Rainer G.
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
10
Mixed-Signal Multi-Core Circuit Architecture for a Reliable Task Distribution
Authors:
Rosen, Julius von; Hedrich, Lars
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
11
On the Automated Verification of User-defined MBIST Algorithms
Authors:
Kinseher, Josef; Richter, Michael; Polian, Ilia
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
12
Stochastic analysis of degradation and variations in CMOS-Transistors
Authors:
Hillebrand, Theodor; Hellwege, Nico; Heidmann, Nils; Paul, Steffen; Peters-Drolshagen, Dagmar
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
13
Symbolic Fault Modeling and Model Counting for the Identification of Critical Gates in Digital Circuits
Authors:
Bernardini, Alessandro; Schlichtmann, Ulf
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
14
Thermal and mechanical simulations for the improvement of the lifespan of highly-integrated systems
Authors:
Heinig, Andy; Papaioannou, Dimitrios
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design
15
Yield Analysation and Optimization Methods for Active CMOS Pixels
Authors:
Lindner, Claus; Soell, Christopher; Roeber, Juergen; Baenisch, Andreas; Weigel, Robert
Conference:
ZuE 2015 - 8. GMM/ITG/GI-Fachtagung Zuverlässigkeit und Entwurf – Reliability by Design