IEC 60749-39:2021 RLVSemiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
136.00 €
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IEC 62830-8:2021Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
249.99 €
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IEC 63244-1:2021Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
249.99 €
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IEC 63287-1:2021Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
280.00 €
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IEC 62435-9:2021Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
80.00 €
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IEC 63229:2021Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
155.00 €
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IEC 62830-7:2021Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 7: Linear sliding mode triboelectric energy harvesting
249.99 €
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IEC 62830-5:2021Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
80.00 €
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IEC 62435-7:2020Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
115.00 €
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IEC 60749-20:2020Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
200.00 €
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IEC 60749-20:2020 RLVSemiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
340.00 €
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IEC 60749-30:2020Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
80.00 €
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IEC 60749-30:2020 RLVSemiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
136.00 €
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IEC 60749-41:2020Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
155.00 €
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IEC 62373-1:2020Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
155.00 €
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IEC 60749-15:2020 RLVSemiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
68.00 €
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IEC 60749-15:2020Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
40.00 €
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IEC 63068-3:2020Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
200.00 €
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IEC 62435-8:2020Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
115.00 €
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IEC 62435-3:2020Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
80.00 €
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