IEC 60749-30:2020 RLVSemiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
91.00 €
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IEC 60749-41:2020Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
145.00 €
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IEC 62373-1:2020Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
145.00 €
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IEC 60749-15:2020 RLVSemiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
52.00 €
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IEC 60749-15:2020Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
40.00 €
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IEC 63068-3:2020Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
180.00 €
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IEC 62435-8:2020Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
110.00 €
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IEC 62435-3:2020Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
70.00 €
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IEC 62779-4:2020Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
110.00 €
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IEC 62830-6:2019Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
145.00 €
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IEC 60749-20-1:2019 RLVSemiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
332.00 €
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IEC 60749-20-1:2019Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
255.00 €
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IEC 63150-1:2019Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
215.00 €
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IEC 62951-6:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
145.00 €
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IEC 62951-2:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
40.00 €
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IEC 60749-18:2019 RLVSemiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
189.00 €
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IEC 60749-18:2019Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
145.00 €
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IEC 60749-17:2019Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
40.00 €
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IEC 62830-4:2019Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
215.00 €
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IEC 62951-4:2019Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
70.00 €
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