Draft:
E DIN EN IEC 61967-8 VDE 0847-21-8:2024-01Integrated circuits – Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions – IC stripline method |
Standard:
DIN EN IEC 61967-4 VDE 0847-21-4:2023-08Integrated circuits – Measurement of electromagnetic emissions Part 4: Measurement of conducted emissions – 1 Ohm/150 Ohm direct coupling method |
Standard:
DIN EN IEC 61967-1 VDE 0847-21-1:2019-09Integrated circuits – Measurement of electromagnetic emissions Part 1: General conditions and definitions |
Standard:
DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08Integrated circuits – Measurement of electromagnetic emissions Part 3: Measurement of radiated emissions – Surface scan method |
Standard:
DIN EN 61967-8 VDE 0847-21-8:2012-04Integrated circuits – Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions – IC stripline method |