DIN EN 62435-5 VDE 0884-135-5:2017-10

Electronic components – Long-term storage of electronic semiconductor devices

Part 5: Die and wafer devices

DIN EN 62228-2 VDE 0847-28-2:2017-09

Integrated circuits – EMC evaluation of transceivers

Part 2: LIN transceivers

DIN EN 62433-4 VDE 0847-33-4:2017-05

EMC IC modelling

Part 4: Models of integrated circuits for RF immunity behavioural simulation – Conducted immunity modelling (ICIM-CI)

DIN EN 62132-1 VDE 0847-22-1:2016-09

Integrated circuits – Measurement of electromagnetic immunity

Part 1: General conditions and definitions

DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08

Integrated circuits – Measurement of electromagnetic emissions

Part 3: Measurement of radiated emissions – Surface scan method

DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08

Integrated circuits – Measurement of electromagnetic immunity

Part 9: Measurement of radiated immunity – Surface scan method

DIN EN 62215-3 VDE 0847-23-3:2014-04

Integrated circuits – Measurement of impulse immunity

Part 3: Non-synchronous transient injection method

DIN EN 62132-8 VDE 0847-22-8:2013-03

Integrated circuits – Measurement of electromagnetic immunity

Part 8: Measurement of radiated immunity – IC stripline method

DIN EN 61967-8 VDE 0847-21-8:2012-04

Integrated circuits – Measurement of electromagnetic emissions

Part 8: Measurement of radiated emissions – IC stripline method

DIN EN 62132-2 VDE 0847-22-2:2011-07

Integrated circuits – Measurement of electromagnetic immunity

Part 2: Measurement of radiated immunity – TEM cell and wideband TEM cell method