IEC 61580-9:1996
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
Ausgabedatum:
1996-07
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 15 VDE-Artnr.: 206929
Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.